WILLIAM R. EISENSTADT
Associate Professor

 

Education:

PhD, EE, Stanford University, 1986
MS, EE, Stanford University, 1981
BSEE, EE, Stanford University, 1979

Contact Information:

Email: wre@tec.ufl.edu
Phone: 352-392-4946
Office: 529 New Engineering Building
Homepage:  www.tec.ufl.edu/~wre/

Program Affiliation:

Area:  Electronics
Lab:   Electronic Circuits Laboratory

Fields of Interest:

• Integrated circuit and packaging technology
• Novel devices
• Single electron transistor array design and application
• Non-volatile semiconductor memory
• Wafer scale integration
• System-on--a-chip technology

Employment:

1990 - Associate Professor, Electrical & Computer Engineering, University of Florida
1986 - Assistant Professor, Electrical & Computer Engineering, University of Florida
1983 - Provisional Assistant Professor, Electrical & Computer Engineering, University of Florida

Refereed Journals in the Last 3 Years:

2008
Q. Yin, W. Eisenstadt and T. Xia,” Wireless System for Microwave Test Signal Generation “Wireless System for Microwave Test Signal Generation,” Design and Test of RF IC Chips, IEEE Design & Test of Computers, March-April 2008, pp. 160-166

K. Jung, L. A. Hayden, O. D. Crisalle, W. R. Eisenstadt, R. M. Fox, P. Navratil, R. L. Campbell, C. McCuen, and M. Lewis “A New Characterization and Calibration Method for 3 dB-Coupled On-Wafer Measurements,”accepted to the IEEE Micro. Theory and Tech, March, 2008

2007
K. Jung, R. L. Campbell, P. Navratil, M. F. Andrews, C. McCuen, W. R. Eisenstadt, and R. M. Fox, “Marchand Balun Embedded Probe,” accepted to the IEEE Micro. Theory and Tech, November, 2007

2006
T. Zhang, W. R. Eisenstadt, R. M. Fox, and Q. Yin,  “20 GHz Bipolar RF RMS Power Detectors,” Solid-State Circuits, IEEE Journal of, Digital Object Identifier 10.1109/JSSC.2006.880592,  vol. 41,  no. 9,  pp. 2188 – 2192, Sept. 2006.

K. Jung, W. R. Eisenstadt and R. M. Fox, “SPICE-Based Mixed-Mode S-Parameter Calculations for Four Port Circuits,” IEEE-Trans on CAD, Vol. 25, No. 5, pp. 909 – 913, May 2006.

2005
J.-S. Yoon and W. R. Eisenstadt, "Embedded Loopback Test for RF ICs," IEEE Trans. on Inst and Meas., Special Issue, vol. 54, no. 5, pp 1715-1720, October 2005.

Q. Yin, W. R. Eisenstadt, R. M. Fox, and T. Zhang, "A Translinear-Based RF RMS Detector for Embedded Test of RF ICs," IEEE Trans on Inst and Meas., Special Issue, vol. 54, no. 5, pp 1708-1714, Oct. 2005

T. C. Chau, B. A. Welt, and W. R. Eisenstadt, "Analysis and Characterization of Transponder Antennae for Radio Frequency Identification (RFID) Systems,", Journal of Packing Science and Technology, published on-line, Sept. 12, 2005.

C. Cho, W.R. Eisenstadt, B. Stengel, and E. Ferrier, "IIP3 Estimation from the Gain Compression Curve," IEEE Trans. on MTT, vol. 53, no. 4, Apr. 2005, pp. 1197-1202

2004
Y. Eo, S. Shin, W. R. Eisenstadt and J. Shim, "A Decoupling Technique for Efficient Timing Analysis of VLSI Interconnects with Dynamic Current Switching, IEEE Trans.on CAD , vol. 23, no. 9, Sept. 2004, pp. 1321-1337

S. Shin, Y. Eo, W. R. Eisenstadt and J. Shim, "Analytical Models and Algorithms for the Efficient Signal Integrity Verification of Inductance-Dominant Multi-Coupled VLSI Interconnects," IEEE-Trans. on VLSI, vol. 12, no. 4, pp. 395-407, April 2004.

R. M. Fox, H. J. Ko, and W. R. Eisenstadt, "Differential Log-Domain Filters with High-Gain Common-Mode Feedback," IEEE Trans. on Cir. and Sys., Part 1, vol.:51, no. 2 , pp 254-263, Feb. 2004.

Contracts and Grants:

• Lockheed Martin, "High-Velocity Projectile Impact Sensor Technology"
• Semiconductor Research Corp., "In Situ Stacked Chip and 3-D Package Characterization, Modeling and Verification'
• Semiconductor Research Corp., "Automatic RF Impedance Correction Circuits for SoC RF/Mixed-Signal ATE Test"
• Semiconductor Research Corp, "In Situ Characterization of High-Speed Digital and RF Interconnect-Chip-Package Systems"
• Semiconductor Research Corp., "C2S2 Marco Focus Center for Circuits and Systems Solutions"

Honors and Awards:

2005 - SRC Inventor Recognition Award
1996 - AT&T Paradyne Spot Light Award

Patents:

• UF Invention Disclosure #12781,“Broadband Active Balun using Combined Cascode-Cascade Configuration,” with K. Jung, W. R. Eisenstadt, R. M. Fox, January 2008
• UF Invention Disclosure #12780, “Broadband Active Directional Coupler,” with K. Jung, W. R. Eisenstadt, R. M. Fox, January 2008
• UF Invention Disclosure #11848, "A Compact S-Parameter Measuring Device for RF/Microwave Test", with T. Zhang and R. M. Fox, April 6, 2005
• UF Invention Disclosure #11834,"Embedded S-parameter Measurements", with J.S. Yoon, March 2005
• UF. #11649 and UF # 11669 combined, "Embedded IC Test Circuits and Methods," with W. R. Eisenstadt, R. M. Fox, J.S. Yoon and T. Zhang, U.S. Patent application, March 2005.
• W. R. Eisenstadt and J. Ahn, "Distributed/RF Microwave Peak/Power Detector," UF Invention Disclosure #11762, January 6, 2005
• UF #11669 Invention disclosure, "Embedded loopback for RF Test," with J.-S. Yoon, August 26, 2004.
• UF Invention Disclosure # 11649, "A Robust RF Peak Detector and Pseudo RMS Detector for Embedded Test," with T. Zhang and R. M. Fox, July 27, 2004.
• UF Invention Disclosure # 111646B, "Method for Verifying Authenticity of Products," with A. Welt, July 26, 2004
• University of Florida and SRC Contract 952.001 Invention Disclosure, "On-chip RF Power Detector", with Q. Lin and R.M. Fox, November 6, 2003.
• University of Florida and SRC Contract 952.001 Invention Disclosure, "On-chip RF Power Detector",  with T. Zhang and R. Fox, October 13, 2003.
• Patent Application #20040145917, "Integrated power supply circuit for simplified boad design", October 2003
• UF Invention Disclosure #11323, "Higher Order Harmonic Cancellation Amplifier Using a Phase Shifter", with K. Jung, and R. Fox, August 2003.
• Patent Application #10667596, "Integrated Voltage Boost Circuit for Simplified Board Design", filed Oct 2, 2003
• Patent Application #20030006413, "Semiconductor test system and associated methods for wafer level acceptance testing", with Ravi Chawla, Robert Fox, Dan F. Hemmenway, Jeffrey M. Johnston, and Chris A. McCarty, April 2002
• 5,793,213, "Method and Apparatus for Calibrating a Network Analyzer", with D. E. Bockelman, August 11, 1998
• 5,561,378, " Circuit Probe for Measuring a Differential Circuit", with D. E. Bockelman, October 1, 1996
• 5,495,173, "Method and Apparatus for Characterizing a Differential Circuit", with D. E. Bockelman, February 1996
• 5,501,877, " Colloidally-Enhanced Chemical Vapor Deposition for Patterned Diamond Film", with J. H. Adair, R. K. Singh, S. S. Staehle, March 26, 1996
• 5,440,130, " X-ray Imaging System and Solid State Detector Therefor", with J. D. Cox and R. M. Fox, Aug 8, 1995
• 5,220,170, " X-ray Imaging System and Solid State Detector Therefor", with J. D. Cox and R. M. Fox, June 15, 1993