2008
Younsung Choi, Toshikazu Nishida, and Scott E. Thompson, “Impact of mechanical stress on direct and trap-assisted gate leakage currents in p-type silicon metal-oxide-semiconductor capacitors,” Appl. Phys. Lett. Vol. 92, pp. 173507-1 - 173507-3, 8 April 2008.
Fei Liu, Alex Phipps, Stephen Horowitz, Khai Ngo, Louis Cattafesta, Toshikazu Nishida, and Mark Sheplak, “Acoustic energy harvesting using an electromechanical Helmholtz resonator,” J. Acoust. Soc. Am., Vol. 123, pp. 1983-1990, April 2008.
Younsung Choi, Toshinori Numata, Toshikazu Nishida, Rusty Harris, and Scott E. Thompson, “Impact of mechanical stress on gate tunneling currents of germanium and silicon p-type metal-oxide-semiconductor field-effect transistors and metal gate work function,” J. Appl. Phys., Vol. 103, pp. 064510-1 - 064510-5, 24 March 2008.
Justin Sanchez, Jose C. Principe, Toshikazu Nishida, Rizwan Bashirullah, John G. Harris, Jose A. B. Fortes, “Technology and Signal Processing for Brain-Machine Interfaces,” IEEE Signal Processing Magazine, Vol. 25, pp. 29-40, January 2008.
Jian Liu, David T. Martin, Karthik Kadirvel, Toshikazu Nishida, Louis Cattafesta, Mark Sheplak, and Brian P. Mann, “Nonlinear model and system identification of a capacitive dual-backplate MEMS microphone,” Journal of Sound and Vibration, Vol. 309, Issues 1-2, pp 276-292, January 2008.
2007
David Martin, Jian Liu, Karthik Kadirvel, Robert Fox, Mark Sheplak, and Toshikazu Nishida, “A micromachined dual-backplate capacitive microphone for aeroacoustic measurements,” J. Microelectromechanical Systems, Vol. 16, No. 6, pp. 1289-1302, December 2007.
Stephen Horowitz, Toshikazu Nishida, Louis Cattafesta III, and Mark Sheplak, “Development of a micromachined piezoelectric microphone for aeroacoustics applications,” J. Acoust. Soc. Am., Vol.122, pp. 3428-3436, December 2007.
Younsung Choi, Ji-Song Lim, Toshinori Numata, Toshikazu Nishida, and Scott E. Thompson, “Mechanical stress altered electron gate tunneling current and extraction of conduction band deformation potentials for germanium,” J. Appl. Phys, Vol. 102, pp. 104507-1 - 104507-5, 30 November 2007.
Guangyu Sun, Yongke Sun, Toshikazu Nishida, and Scott E. Thompson, “Hole mobility in silicon inversion layers: Stress and surface orientation,” J. Appl. Phys. 102, pp. 084501-1--084501-7, 18 October 2007.
J. Jun, B. Chou, J. Lin, A. Phipps, X. Shengwen, K. Ngo, D. Johnson, A. Kasyap, T. Nishida, H.T. Wang, B.S. Kang, F. Ren, L.C. Tien, P.W. Sadik, D.P. Norton, L.F. Voss, and S.J. Pearton, “A Hydrogen Leakage Detection System Using Self-Powered Wireless Hydrogen Sensor Nodes,” Solid-State Electron. 51, pp. 1018-1022, July 2007.
Fei Liu, Stephen Horowitz, Toshikazu Nishida, Louis Cattafesta, and Mark Sheplak, “A Multiple Degree of Freedom Electromechanical Resonator,” J. Acoust. Soc. Am. 122, pp. 291-301, July 2007.
Yongke Sun, Scott E. Thompson, and Toshikazu Nishida, “Physics of Strain Effects in Semiconductors and Metal-Oxide-Semiconductor Field-effect Transistors", Journal of Applied Physics 101, pp. 104503-1 – 104503-22, 18 May 2007.
Sagar Suthram, John C. Ziegert, Toshikazu Nishida, and Scott E. Thompson, “Piezoresistance Coefficients of (100) Silicon nMOSFETs Measured at Low and High (~1.5GPa) Channel Stress”, IEEE Electron. Dev. Lett., Vol. 28, pp. 58 – 61, January 2007.
Shengwen Xu, Khai D. T. Ngo, Toshikazu Nishida, Gyo-Bum Chung, and Attma Sharma, “Low Frequency Pulsed Resonant Converter for Energy Harvesting,” IEEE Trans. Power Electronics, Vol. 22, pp. 63 – 68, January 2007.
2006
Melih Papila, R. Hafkta, T. Nishida, M. Sheplak, “Piezoresistive Microphone Design Pareto Optimization: Tradeoff Between Sensitivity and Noise Floor,” IEEE JMEMS, Vol. 15, pp. 1632 – 1643, December 2006.
Ji-Song Lim, Xiaodong Yang, Toshikazu Nishida, and Scott E. Thompson, “Measurement of Conduction Band Deformation Potential Constants Using Gate Direct Tunneling Current in n-MOSFETs Under Mechanical Stress”, Applied Physics Letters, Vol. 89, p 073509, 14 August 2006.
S. B. Horowitz, M. Sheplak, L. N. Cattafesta, and T. Nishida, “A MEMS Acoustic Energy Harvester, J. Micromech. Microeng., Vol. 16, pp. S174–S181, 2006.
Justin C. Sanchez, Nicolas Alba, Toshikazu Nishida, Christopher Batich, and Paul R. Carney, “Structural Modifications in Chronic Microwire Electrodes for Cortical Neuroprosthetics: A Case Study,” IEEE Trans. Neural Systems and Rehab. Engr., vol. 14(2), pp. 217-221, June 2006.
S. E. Thompson, G. Sun, Y. Choi, and T. Nishida, "Uniaxial Process Induced Strained Si: Estending the CMOS Roadmap," IEEE Trans. Electron Dev., 2006
R. Dieme, G. Bosman, M. Sheplak, and T. Nishida, "Source of Excess Noise in Silicon Piezoresistive Microphones," J. Acoust. Soc. Am., 119, pp 2710-2720, May 2006
X. Yang, J. Lim, G. Sun, K. Wu, T. Nishida, and S. E. Thompson, "Strain-induced Changes in the Gate Tunneling Currents in p-channel Metal-Oxide-Semiconductor Field-Effect Transistors," Applied Phys. Lett., 88, 052108, January 2006
University of Florida 
TOSHIKAZU NISHIDA