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Last modified: October 27, 2009  
University of Florida

Semiconductor Characterization & Optical Laboratory

Research in these labs, under the direction of Dr. Sheng Li, concentrate on the defect and interface characterization of silicon-on-insulator (SOI) materials and devices. Others improve high speed and optoelectronic devices. Another area of research deals wtih quantum-well infrared photodetectors for long wavelength staring focal plane imaging array applications. A multi-discipline research program is concerned with the development of high efficiency thin film InCuSe2 solar cells.

The lab is equipped with an HP-semiconductor paramter analyze; computer controlled HP-C-t, C-V; Picoammeter measurement station; computer controlled DLTS system; PAR box-car spectral analyzer; MMR LN probe station, three monochromaters covering wavelengths from visible to 20 µm for detecting spectral response measurements; closed cycle liquid helium cryogenic system; FTIR system.