Dr. Swarup Bhunia has been awarded the Steven Yatauro Faculty Fellow for excellence in research and dedication in the field of Electrical Engineering, specifically the areas of: Hardware Security and Trust with emphasis on: anti-counterfeiting, anti-Trojan, authentication, & antipiracy solutions, Adaptive Nanocomputing with emerging technologies, Computing at Extreme, with emphasis on: nanomechanical logic and memory, Low-power and Robust Electronics, Bioimplantable and Wearable Systems. Steve Yatauro is an alum of ECE (BSEE in 1989). He had worked for 25 years at Exxon, starting as a telecommunications engineer in Houston and currently serves as Vice President – Production, Upgrading for Syncrude, Canada Ltd. This is the First Faculty Fellow in ECE. This $100K endowment was possible with a 3:1 match from Exxon. 

Dr. Swarup Bhunia received his B.E. (Hons.) from Jadavpur University, Kolkata, India, and the M.Tech. degree from the Indian Institute of Technology (IIT), Kharagpur. He received his Ph.D. from Purdue University, IN, USA, in 2005. Currently, Dr. Bhunia is a preeminence professor and Steven Yatauro Faculty Fellow in the department of Electrical and Computer Engineering at University of Florida, Gainesville, FL, USA. Earlier, Dr. Bhunia has served as the T. and A. Schroeder associate professor of Electrical Engineering and Computer Science at Case Western Reserve University, Cleveland, OH, USA. He has over ten years of research and development experience with over 200 publications in peer-reviewed journals and premier conferences and four books (three edited) in the area of VLSI design, CAD and test techniques. His research interests include low power and robust design, hardware security and trust, adaptive nanocomputing and novel test methodologies. He has worked in the semiconductor industry on RTL synthesis, verification, and low power design for about three years. Dr. Bhunia received IBM Faculty Award (2013), National Science Foundation (NSF) career development award (2011), Semiconductor Research Corporation (SRC) technical excellence award (2005) as a team member, best paper award in IEEE BioMedical Circuits and Systems Conference (BioCAS 2016), best paper award in International Conference on VLSI Design (VLSI Design 2012), best paper award in International Conference on Computer Design (ICCD 2004), best paper award in Latin American Test Workshop (LATW 2003), and best paper nomination in Asia and South Pacific Design Automation Conference (ASP-DAC 2006) and in Hardware Oriented Test and Security (HOST 2010), nomination for John S. Diekhoff Award, Case Western Reserve University (2010) and SRC Inventor Recognition Award (2009). 

Dr. Bhunia has been serving as founding editor-in-chief in Journal of Hardware and Systems Security (HaSS), an associate editor of IEEE Transactions on CAD (TCAD), IEEE Transactions on Multi-Scale Computing Systems (TMSCS), ACM Journal of Emerging Technologies (JETC), and Journal of Low Power Electronics (JOLPE). He has served as a guest editor of IEEE Design & Test of Computers (2010, 2013), IEEE Computer Magazine (2016), IEEE Transcation on CAD (2015), and IEEE Journal on Emerging and Selected Topics in Circuits and Systems (2014). He has served as co-program chair of IEEE IMS3TW 2011, IEEE NANOARCH 2013, IEEE VDAT 2014, and IEEE HOST 2015, and in the technical program committee of Design Automation Conference (2014-2015), Design Automation and Test in Europe (DATE 2006-2010), Hardware Oriented Trust and Security Symposium (HOST 2008-2010), IEEE/IFIP International Conference on VLSI (VLSI SOC 2008), Test Technology Educational Program (TTEP 2006-2008), International Symposium on Low Power Electronics and Design (ISLPED 2007-2008), IEEE/ACM Symposium on Nanoscale Architectures (NANOARCH 2007-2010), IEEE International Conference on VLSI (ISVLSI 2008-2010), International Conference of VLSI Design as a track chair (2010) and in the program committee of International Online Test Symposium (IOLTS 2005). Dr. Bhunia has given tutorials on low-power and robust design and test in premier conference including International Test Conferences (ITC 2009), VLSI Test Symposium (VTS 2010), and Design Automation and Test in Europe (DATE 2009). He is a senior member of IEEE. 


For more information on Dr. Bhunia, visit http://swarup.ece.ufl.edu/index.html.