Huikai Xie Elected SPIE Fellow
Congratulations to Huikai Xie, ECE Florida professor, just promoted to Fellow of the International Society for Optics and Photonics (SPIE). Dr. Xie is recognized for his achievements in optical MEMS and optical endoscopic imaging.
Xie has made major contributions in the development and understanding of the microelectro-mechanical systems (MEMS) community and has made remarkable contributions in both core MEMS technology and MEMS applications, especially in the optical MEMS field. He was the first to demonstrate MEMS-based optical coherence tomography endoscopic imaging, which opened a new field of optical microendoscopy. Additionally, his group developed a series of MEMS endoscopic fiber-optic probes that overcame issues such as high drive voltage, low fill factor and small scan angle of other MEMS probes.
This has been an eventful year for Dr. Xie, who recently was elevated to the rank of IEEE Fellow.