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Electronics

This division covers a broad range of topics from the manufacturing of integrated circuits to their applications in real world systems.

Current research includes:

  • adaptive circuits
  • radio frequency circuits
  • hardware security
  • VLSI design
  • co-packaged photonic circuits for AI acceleration and reconfigurable computing 
  • acoustic sensing in harsh environments
  • microwave device and interconnect modeling
  • IC test, and modeling of materials,components and circuits for high-frequency power electronics
  • bioelectronics
  • energy harvesting circuits

Faculty

Area Chair: Hamed Dalir
Photo of Baibhab Chatterjee Baibhab Chatterjee Nelms Rising Star Endowed Professor
352-273-2189

Primary Research Area

Electronics
Research Interests

Energy-Efficient and secure analog/RF/mixed-signal circuits and systems for biomedical and IoT applications; time-domain sensing and sensor interfaces, human body communication, brain-channel communication for untethered neural implants, physical-layer security, low-power wireless and wireline techniques
Honors and Awards

ECE Teaching Excellence Award, 2025
NSF CAREER Award, 2025
Best 3-Minute Thesis Award (Audience Choice), IEEE Microwave Week 2020
Best Paper Awards, IEEE CICC, 2019, CICC 2021, HOST 2018, HOST 2019
Bilsland Dissertation Fellowship (2022) and Andrews Fellowship (2017-2019), Purdue University

Photo of Hamed Dalir Hamed Dalir Associate Professor
352-846-4989

Primary Research Area

Electronics
Research Interests

Mid-IR Photonics, On-chip Light Sources, Classical & Quantum Sensors, Ising Machine, AI Accelerator, Photonics Integrated Circuits
Honors And Awards

Stanford–Elsevier Top 2% Scientists Ranking (top 0.3% in field), 2024–2025
ECE Teaching Excellence Award, 2025
Best Project Collaboration Award, TSMC, 2025
ECE Faculty of the Year (Student Choice), 2024–25
Rising Star in Photonics, ACS, 2025
IAAM Scientist Medal & Fellow, 2024
SPIE Senior Member, 2023
AFWERX Commercialization Solutions, 2022
SPIE Community Champion, 2020
IEEE/Optica Senior Member, 2018
JSPS Fellow, 2015
KAKENHI Early Investigator Award, 2014
JSPS Young Scientist Award, 2014
GCOE Golden Award, Tokyo, 2012
Yoshida Foundation Award, 2009

Photo of William Eisenstadt William Eisenstadt Professor
352-392-4946

Primary Research Area

Electronics
Research Interests

IoT for agriculture, mosquito control, health and safety, IoT networking using LoRaWAN and MESH, IC Test, analog/mixed signal design, RF/microwave circuits

Photo of Domenic Forte Domenic Forte Professor Steven A. Yatauro Faculty Fellow
352-392-1525

Primary Research Area

Electronics
Research Interests

Hardware security and trust, digital VLSI/CAD, and biometrics
Honors and Awards

Distinguished Speaker, Association for Computing Machinery (ACM), 2025
HWCOE Doctoral Dissertation Advisor/Mentoring Award, 2022
2017 Presidential Early Career Award for Scientists and Engineers (PECASE), nominated by DoD, 2019
NSF Faculty Early Career Development Program (CAREER) Award, 2017
Young Investigator Program (YIP) Award by Army Research Office (ARO), 2016
George Corcoran Outstanding Teaching Award by University of Maryland, 2008

Photo of Adam Khalifa Adam Khalifa Assistant Professor, Dean Wayne Chen Faculty Fellow
352-273-1695

Primary Research Area
Electronics
Research Interests
Low-power analog/RF/Mixed-mode ASIC design, miniaturization, wireless powering, electrode design/microfabrication, coil design/fabrication for magnetic stimulation, neural stimulation and recording in animal models, and implant packaging
Honors and Awards
NIH Director’s New Innovator Award, 2024
NIH T32 Fellow, 2019
Ferdinand H. Fellow, 2018

Photo of Nima Maghari Nima Maghari Associate Professor
352-392-2767

Primary Research Area

Electronics
Research Interests

High performance data converters, delta-sigma modulators, synthesizable analog to digital converters, biomedical applications

Photo of Wenhsing Wu Wenhsing Wu Instructional Assistant Professor
352-392-2588

Primary Research Area

Electrophysics
Research Interests

Semiconductor electronics, manufacturing, measurement and failure analysis, wireless network testing